Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

High temperature pulsed-gate robustness testing of SiC power MOSFETs

Analysis of neutron-induced single-event burnout in SiC power MOSFETs

[Article] On-line Junction Temperature Estimation of SiC Power MOSFETs through On-state Voltage Mapping

This paper deals with real-time estimation of the junction temperature of SiC power MOSFETs. The junction temperature of one device of a 4-switch module is real-time estimated by measuring its current and on-state voltage VON at each switching period and entering the temperature look-up table of the device. The temperature model is preliminarily obtained in a dedicated commissioning session, wh...

Thermal instability effects in SiC Power MOSFETs

Silicon carbide (SiC) power MOSFETs are characterised by potentially thermally unstable behaviour over a broad range of bias conditions. In the past, such behaviour has been shown for silicon (Si) MOSFETs to be related to a reduction of Safe Operating Area at higher drain–source bias voltages. For SiC MOSFETs no characterisation exists yet. This paper presents a thorough experimental investigat...

Low Voltage Squarer Using Floating Gate MOSFETs

A new low-voltage floating gate MOSFET (FGMOS) based squarer using square law characteristic of the FGMOS is proposed in this paper. The major advantages of the squarer are simplicity, rail-to-rail input dynamic range, low total harmonic distortion, and low power consumption. The proposed circuit is biased without body effect. The circuit is designed and simulated using SPICE in 0.25μm CMOS tec...